Parallel beam approximation for V-shaped atomic force, microscope cantilevers
نویسنده
چکیده
Due to its simplicity, the parallel beam approximation (PBA) is commonly used in the analytical evaluation of the spring constant of V-shaped atomic force microscope (AFM) cantilevers. However, the point of contention regarding the validity of the PBA is as yet an unresolved issue, which has been exacerbated by some recent contradictory reports. In this paper, we present a detailed investigation of the deflection properties of the V-shaped AFM cantilever, and in so doing, show mat the PBA is in fact a valid and accurate approximation, provided the width and length of the parallel rectangular arms are chosen appropriately. As a direct consequence of this finding, we obtain exceedingly simple yet accurate formulas for the V-shaped cantilever, which will be of value to the users of the AFM.
منابع مشابه
GDQEM Analysis for Free Vibration of V-shaped Atomic Force Microscope Cantilevers
V-shaped and triangular cantilevers are widely employed in atomic force microscope (AFM) imaging techniques due to their stability. For the design of vibration control systems of AFM cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. A general differential quadrature element method (...
متن کاملGDQEM Analysis for Free Vibration of V-shaped Atomic Force Microscope Cantilevers
V-shaped and triangular cantilevers are widely employed in atomic force microscope (AFM) imaging techniques due to their stability. For the design of vibration control systems of AFM cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. A general differential quadrature element method (...
متن کاملSusceptibility of atomic force microscope cantilevers to lateral forces
V-shaped cantilevers are used widely in the atomic force microscope ~AFM! due to their perceived enhanced resistance to lateral forces in comparison to rectangular cantilevers. In this article, we rigorously investigate this premise, and in so doing establish that, contrary to established operating principles and intuition, V-shaped AFM cantilevers are generally more prone to the effects of lat...
متن کاملSurface stress induced deflections of cantilever plates with applications to the atomic force microscope: V-shaped plates
Surface stress measurements using atomic force microscopy ~AFM! require theoretical knowledge of the surface stress induced deformation of AFM cantilever plates. In a companion paper @J. E. Sader, J. Appl. Phys. 89, 2911 ~2001!#, a detailed theoretical study of the effects of homogeneous surface stress on rectangular AFM cantilever plates was presented. Since cantilevers of both rectangular and...
متن کاملA Comprehensive Model for Stiffness Coefficients in V-Shaped Cantilevers
During past decade the AFM based nanomanipulation has been focus of attention as the promising nano fabrication approach. The main challenge in this process is the real-time monitoring. Consequently, the dynamic models have been proposed as a solution to the existing challenge. In the modeling approach the magnitudes of the forces are proportional to the stiffness coefficients o...
متن کامل